Double-Observer Line Transect Methods: Levels of Independence
| Year of publication: |
2010
|
|---|---|
| Authors: | Buckland, Stephen T. ; Laake, Jeffrey L. ; Borchers, David L. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 66.2010, 1, p. 169-177
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010948527