Enhanced fluxon transmission through impurities
Fluxon transmission through several impurities of different strength and type (i.e., microshorts and microresistors), placed in a long Josephson junction is investigated. Retrapping current on the impurities is computed as a function of the distance between them, their amplitudes and the dissipation parameter. It is shown that in the case of consequently placed microshorts or microresistors, the retrapping current exhibits a clear minimum as a function of the distance between the impurities. In the case of a microresistor, followed by a microshort, an opposite phenomenon is observed, namely the retrapping current exhibits maximum as a function of the distance between the impurities. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2008
Year of publication: |
2008
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Authors: | Zolotaryuk, Y. |
Published in: |
The European Physical Journal B - Condensed Matter and Complex Systems. - Springer. - Vol. 62.2008, 3, p. 349-355
|
Publisher: |
Springer |
Subject: | 03.75.Lm Tunneling | Josephson effect | Bose-Einstein condensates in periodic potentials | solitons | vortices | and topological excitations | 05.45.Yv Solitons | 74.50.+r Tunneling phenomena | point contacts | weak links | Josephson effects |
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