Estimation & Testing in an Imperfect-Inspection Model
Year of publication: |
1993
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Authors: | Srivastava, M.S. ; Wu, Y. |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 42.1993, 2, p. 280-286
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