Evaluating the risk of patent infringement by means of semantic patent analysis: the case of DNA chips
| Year of publication: |
2008
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|---|---|
| Authors: | Bergmann, Isumo ; Butzke, Daniel ; Walter, Lothar ; Fuerste, Jensp ; Moehrle, Marting ; Erdmann, Volkera |
| Published in: |
R & D management. - Oxford [u.a.] : Wiley-Blackwell, ISSN 0033-6807, ZDB-ID 1215620. - Vol. 38.2008, 5, p. 550
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