Exact tests for the rasch model via sequential importance sampling
Year of publication: |
2005
|
---|---|
Authors: | Chen, Yuguo ; Small, Dylan |
Published in: |
Psychometrika. - Springer. - Vol. 70.2005, 1, p. 11-30
|
Publisher: |
Springer |
Subject: | Rasch model | exact tests | goodness of fit tests | Monte Carlo methods | sequential importance sampling |
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