Exact Tests of Goodness of Fit of Log-Linear Models for Rates
| Year of publication: |
1999
|
|---|---|
| Authors: | McDonald, John W. ; Smith, Peter W. F. ; Forster, Jonathan J. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 55.1999, 2, p. 620-624
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010948487