Examiner Characteristics and Patent Office Outcomes
| Year of publication: |
2012
|
|---|---|
| Authors: | Lemley, Mark A. ; Sampat, Bhaven |
| Published in: |
The review of economics and statistics. - Cambridge, Mass : MIT Press, ISSN 0034-6535, ZDB-ID 2079628. - Vol. 94.2012, 3 (1.8.), p. 817-828
|