Explaining the Short- and Long-Term IPO Anomalies in the US by R&D
Year of publication: |
2006
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Authors: | Guo, Re-Jin ; Lev, Baruch ; Shi, Charles |
Published in: |
Journal of business finance & accounting : JBFA. - Oxford : Blackwell, ISSN 0306-686X, ZDB-ID 1929628. - Vol. 33.2006, 3, p. 550-579
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