Exploring benchmark corporations in the semiconductor industry based on efficiency
Year of publication: |
2017
|
---|---|
Authors: | Tsai, Chia-Han ; Wu, Hung-Yi ; Chen, I-Shuo ; Chen, Jui-Kuei ; Ye, Rih-Wei |
Published in: |
The journal of high technology management research. - Amsterdam [u.a.] : Elsevier, ISSN 1047-8310, ZDB-ID 1041080-6. - Vol. 28.2017, 2, p. 188-207
|
Subject: | Intellectual capital | Corporate governance | Firm value | Efficiency | Semiconductor industry | Data envelopment analysis (DEA) | Data-Envelopment-Analyse | Data envelopment analysis | Halbleiterindustrie | Corporate Governance | Benchmarking | Immaterielle Werte | Intangible assets | Technische Effizienz | Technical efficiency | Halbleiter | Semiconductor | Effizienz | Unternehmenswert | Unternehmenserfolg | Firm performance | Performance-Messung | Performance measurement | Betriebliche Wertschöpfung | Value creation |
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