Formative versus reflective measurement models: Two applications of formative measurement
Year of publication: |
2008
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Authors: | Coltman, Tim ; Devinney, Timothy M. ; Midgley, David F. ; Venaik, Sunil |
Published in: |
Journal of business research : JBR. - New York, NY : Elsevier, ISSN 0148-2963, ZDB-ID 1897731. - Vol. 61.2008, 12, p. 1250-1263
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