Fuzzy reliability using a discrete stress-strength interference model
Year of publication: |
1996
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Authors: | Wan, J. ; Liu, T. |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 45.1996, 1, p. 145-149
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