How does country risk affect innovation? : An application to foreign patents registered in the USA
Suhejla Hoti and Michael McAleer
| Year of publication: |
2006
|
|---|---|
| Authors: | Hoti, Suhejla ; McAleer, Michael |
| Published in: |
Journal of economic surveys. - Oxford [u.a.] : Wiley-Blackwell, ISSN 0950-0804, ZDB-ID 722946-X. - Vol. 20.2006, 4, p. 691-714
|
| Subject: | Länderrisiko | Country risk | Patentrecht | Patent law | Innovation |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10003368509