How knowledge map fit and personalization affect success of KMS in high-tech firms
| Year of publication: |
2009
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|---|---|
| Authors: | Lai, Jung-Yu ; Wang, Chao-Te ; Chou, Chun-Yi |
| Published in: |
Technovation : the international journal of technological innovation, entrepreneurship and technology management. - Amsterdam : Elsevier Scientific Publishing Co., ISSN 0166-4972, ZDB-ID 83860. - Vol. 29.2009, 4, p. 313-325
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