How to Count Patents and Value Intellectual Property : Uses of Patent Renewal and Application Data
Year of publication: |
[2021]
|
---|---|
Authors: | Lanjouw, Jean O. ; Pakes, Ariel ; Putnam, Jonathan |
Publisher: |
[S.l.] : SSRN |
Subject: | Patent | Welt | World | Innovation | Immaterialgüterrechte | Intellectual property rights | Messung | Measurement | Patentrecht | Patent law |
Extent: | 1 Online-Ressource (33 p) |
---|---|
Series: | NBER Working Paper ; No. w5741 |
Type of publication: | Book / Working Paper |
Language: | English |
Notes: | Nach Informationen von SSRN wurde die ursprüngliche Fassung des Dokuments September 1996 erstellt |
Source: | ECONIS - Online Catalogue of the ZBW |
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