How to peel a data envelopment analysis frontier : a cross-validation-based approach
Year of publication: |
2023
|
---|---|
Authors: | Aparicio, Juan ; Esteve, Miriam |
Published in: |
Journal of the Operational Research Society. - London : Taylor and Francis, ISSN 1476-9360, ZDB-ID 2007775-0. - Vol. 74.2023, 12, p. 2558-2572
|
Subject: | cross-validation | Data Envelopment Analysis | Data Generating Process | overfitting problems | technical efficiency | Theorie | Theory | Technische Effizienz | Technical efficiency | Data-Envelopment-Analyse | Data envelopment analysis |
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