Incidental trends and the power of panel unit root tests
Year of publication: |
2007
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Authors: | Moon, Hyungsik Roger ; Perron, Benoit ; Phillips, Peter C.B. |
Published in: |
Journal of econometrics. - Amsterdam [u.a.] : Elsevier, ISSN 0304-4076, ZDB-ID 1848616. - Vol. 141.2007, 2, p. 416-459
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