Innovation characteristics, industrial clusters, and intra-industry spillover effects in integrated circuit industry
Bi-Huei Tsai and Huang Wen Chen
| Year of publication: |
2013
|
|---|---|
| Authors: | Tsai, Bi-huei ; Chen, Huang Wen |
| Published in: |
International journal of innovation and technology management. - Singapore [u.a.] : World Scientific Publishing, ISSN 0219-8770, ZDB-ID 2225555-2. - Vol. 10.2013, 4, p. 1-20
|
| Subject: | Innovation | patent | spillover | panel data | Hausman test | Spillover-Effekt | Spillover effect | Regionales Cluster | Regional cluster | Patent | Industrie | Manufacturing industries | Industrieforschung | Industrial research | Panel | Panel study |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10010198169