Integrated design of run-to-run PID controller and SPC monitoring for process disturbance rejection
Year of publication: |
1999
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Authors: | Tsung, Fugee ; Shi, Jianjun |
Published in: |
IIE transactions / Institute of Industrial Engineers, Norcross, Ga : industrial engineering and development. - Philadelphia, Pa : Taylor & Francis, ISSN 0569-5554, ZDB-ID 2460191. - Vol. 31.1999, 6, p. 517-528
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