Interfacial crack front wandering: influence of quenched noise correlations
We discuss the influence of spatially correlated noise on the wandering exponent of the crack-front line during slow in-plane crack propagation. For a uniform noise, the wandering exponent in the stastically stationary regime is .35±0.02, while the dynamic exponent is z=0.75±0.02. For short-range Gaussian correlations, the wandering exponent is shown to be .50±0.03 in the small fluctuation limit and .35±0.02 in the large fluctuation limit which can be shown to be consistent with the uniform case. In the case of long-range correlations, characterized by a self-affine exponent ζt, the wandering exponent is shown to scale as ζt+1 for a wide range of ζt between −1.0 and +1.0. These results are discussed with reference to recent experiments of slow in-plane crack propagation between two annealed Plexiglas blocks.
Year of publication: |
1999
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Authors: | Schmittbuhl, Jean ; Vilotte, Jean-Pierre |
Published in: |
Physica A: Statistical Mechanics and its Applications. - Elsevier, ISSN 0378-4371. - Vol. 270.1999, 1, p. 42-56
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Publisher: |
Elsevier |
Subject: | Interfacial crack | Pinning | Roughness |
Saved in:
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