International R&D transfer and technical efficiency : evidence from panel study using stochastic frontier analysis
Year of publication: |
2012
|
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Authors: | Wang, Miao ; Wong, M. C. Sunny |
Published in: |
World development : the multi-disciplinary international journal devoted to the study and promotion of world development. - Amsterdam : Elsevier Science, ISSN 0305-750X, ZDB-ID 185339-9. - Vol. 40.2012, 10, p. 1982-1998
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Subject: | Technische Effizienz | Technical efficiency | Technologietransfer | Technology transfer | Panel | Panel study | Welt | World | Schätzung | Estimation |
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