Is there a tradeoff between average patent pendency and examination errors?
Year of publication: |
2008
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Authors: | Batabyal, Amitrajeet A. ; Nijkamp, Peter |
Published in: |
International review of economics & finance : IREF. - Amsterdam [u.a.] : Elsevier, ISSN 1059-0560, ZDB-ID 11374767. - Vol. 17.2008, 1, p. 150-158
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Saved in:
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