Laypeople's and Experts' Perception of Nanotechnology Hazards
Year of publication: |
2007
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Authors: | Siegrist, Michael ; Keller, Carmen ; Kastenholz, Hans ; Frey, Silvia ; Wiek, Arnim |
Published in: |
Risk analysis : an international journal. - Malden, Mass. [u.a.] : Blackwell Publ, ISSN 0272-4332, ZDB-ID 7786608. - Vol. 27.2007, 1, p. 59-70
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