Life Testing and Analysis - Linear Inference for Type-II Censored Lifetime Data of Reliability Systems With Known Signatures
Year of publication: |
2011
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Authors: | Balakrishnan, N ; Ng, H K T ; Navarro, J |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 60.2011, 2, p. 426-441
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