Mapping the broad societal impact of patents
Year of publication: |
2023
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Authors: | Waal, Mark B. van der ; Feddema, Jelle J. ; Burgwal, Linda H. M. van de |
Published in: |
Technovation : the international journal of technological innovation, entrepreneurship and technology management. - Amsterdam : Elsevier Scientific Publishing Co., ISSN 0166-4972, ZDB-ID 8386-0. - Vol. 128.2023, p. 1-15
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Subject: | Patents | Innovation | Societal impact | Interdisciplinarity | Complexity | Patent | Patentrecht | Patent law | Sozialer Wandel | Social change |
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