Marginal Mark Regression Analysis of Recurrent Marked Point Process Data
| Year of publication: |
2009
|
|---|---|
| Authors: | French, Benjamin ; Heagerty, Patrick J. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 65.2009, 2, p. 415-422
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010946892