Materials - Failure Probability Evaluation Due to Tin Whiskers Caused Leads Bridging on Compressive Contact Connectors
| Year of publication: |
2008
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| Authors: | Huang, W. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 57.2008, 3, p. 426-430
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