Measurement Biases in Panel Data
Year of publication: |
1989-06-01
|
---|---|
Authors: | Meurs, Henk ; Van Wissen, Leo ; Visser, Jacqueline |
Institutions: | Institute for Transportation Studies (ITS), University of California-Berkeley |
Subject: | Architecture | attrition | measurement error | mobility | multi-day diaries | panel | surveys |
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