Measurement System Analysis for Binary Inspection: Continuous Versus Dichotomous Measurands
Year of publication: |
2011
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Authors: | de Mast, Jeroen ; Erdmann, Tashi P ; van Wieringen, Wessel N |
Published in: |
Journal of quality technology : a quarterly journal of methods, applications and related topics. - Milwaukee, Wis. : ASQ, ISSN 0022-4065, ZDB-ID 4105126. - Vol. 43.2011, 2, p. 99-113
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