Measuring dynamic capabilities : practices and performance in semiconductor manufacturing
Year of publication: |
2009
|
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Authors: | Macher, Jeffrey T. ; Mowery, David C. |
Published in: |
British journal of management : BJM. - Oxford : Blackwell Publ., ISSN 1045-3172, ZDB-ID 1055434-8. - Vol. 20.2009, p. 41-62
|
Subject: | Performance-Messung | Performance measurement | Produktionstechnik | Manufacturing technology | Wettbewerb | Competition | Dynamische Kompetenzen | Dynamic capabilities | Halbleiterindustrie | Semiconductor industry | USA | United States |
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