Measuring the depth and breadth of technological impact with patent citations
Year of publication: |
2022
|
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Authors: | Christodoulou, Demetris ; Ma, Le ; Matsypura, Dmytro ; Zhang, Yangqi |
Publisher: |
[S.l.] : SSRN |
Subject: | Patent | Bibliometrie | Bibliometrics | Technischer Fortschritt | Technological change | Messung | Measurement |
Description of contents: | Abstract [papers.ssrn.com] |
Extent: | 1 Online-Ressource |
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Type of publication: | Book / Working Paper |
Language: | English |
Notes: | Nach Informationen von SSRN wurde die ursprüngliche Fassung des Dokuments 12, 2019 erstellt Volltext nicht verfügbar |
Source: | ECONIS - Online Catalogue of the ZBW |
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