Measuring the intensity of knowledge flow with patent statistics
Year of publication: |
2002
|
---|---|
Authors: | Fung, Michael Ka-yiu ; Chow, William W. |
Published in: |
Economics letters. - Amsterdam [u.a.] : Elsevier, ISSN 0165-1765, ZDB-ID 717210-2. - Vol. 74.2002, 3, p. 353-358
|
Subject: | Innovation | Wissenstransfer | Knowledge transfer | Patent | USA | United States | 1976-1997 |
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