Measuring the Rate of Obsolescence of Patents in Japanese Manufacturing Firms
Year of publication: |
2008-06
|
---|---|
Authors: | Nakanishi, Yasuo ; Yamada, Setsuo |
Institutions: | Volkswirtschaftliche Fakultät, Ludwig-Maximilians-Universität München |
Subject: | Obsolescence rate | Patent | Innovation | Ordered probit model |
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