Minimal repair under a step-stress test
In the one- and multi-sample cases, in the context of life-testing reliability experiments, we introduce minimal repair processes under a simple step-stress test, based on exponential distributions and an associated cumulative exposure model, and then develop likelihood inference for such a model.
Year of publication: |
2009
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Authors: | Balakrishnan, N. ; Kamps, U. ; Kateri, M. |
Published in: |
Statistics & Probability Letters. - Elsevier, ISSN 0167-7152. - Vol. 79.2009, 13, p. 1548-1558
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Publisher: |
Elsevier |
Saved in:
Online Resource
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