Model-Checking Techniques Based on Cumulative Residuals
| Year of publication: |
2002
|
|---|---|
| Authors: | Lin, D. Y. ; Wei, L. J. ; Ying, Z. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 58.2002, 1, p. 1-12
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010947488