Modeling the Duration of Patent Examination at the European Patent Office
Year of publication: |
2006
|
---|---|
Authors: | Harhoff, Dietmar ; Wagner, Stefan |
Publisher: |
München : Sonderforschungsbereich/Transregio 15 - Governance and the Efficiency of Economic Systems (GESY) |
Subject: | patents | patent examination | survival analysis | patent citations | European Patent Office |
Series: | |
---|---|
Type of publication: | Book / Working Paper |
Type of publication (narrower categories): | Working Paper |
Language: | English |
Other identifiers: | 10.5282/ubm/epub.13381 [DOI] 783580193 [GVK] hdl:10419/94170 [Handle] RePEc:trf:wpaper:170 [RePEc] |
Classification: | C15 - Statistical Simulation Methods; Monte Carlo Methods ; C41 - Duration Analysis ; D73 - Bureaucracy; Administrative Processes in Public Organizations; Corruption ; O34 - Intellectual Property Rights: National and International Issues |
Source: |
-
Modeling the Duration of Patent Examination at the European Patent Office
Harhoff, Dietmar, (2006)
-
Modeling the duration of patent examination at the European Patent Office
Harhoff, Dietmar, (2006)
-
Modeling the Duration of Patent Examination at the European Patent Office
Harhoff, Dietmar, (2006)
- More ...
-
How to measure patent thickets--A novel approach
von Graevenitz, Georg, (2011)
-
Incidence and Growth of Patent Thickets: The Impact of Technological Opportunities and Complexity
Graevenitz, Georg, (2013)
-
Conflict resolution, public goods and patent thickets
Harhoff, Dietmar, (2012)
- More ...