Multi-objectives exception management model for semiconductor back-end environment under turnkey service
Year of publication: |
2007
|
---|---|
Authors: | Guo, R.-S. ; Chiang, D.M. ; Pai, F.-Y. |
Published in: |
Production planning & control : PPC. - London [u.a.] : Taylor & Francis, ISSN 0953-7287, ZDB-ID 10481977. - Vol. 18.2007, 3, p. 203-216
|
Saved in:
Saved in favorites
Similar items by person