Multivariate SPC for recipe preservation of batch processes
Year of publication: |
2010
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Authors: | Kim, Young-il ; Adams, Benjamin M. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 26.2010, 3, p. 267-278
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