On the Accelerated Scan Finite Markov Chain Imbedding Approach
Year of publication: |
2009
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Authors: | Zhao, X. ; Cui, L. |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 58.2009, 2, p. 383-388
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