On the measurement of patent stock as knowledge indicators
Year of publication: |
2006
|
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Authors: | Park, Gwangman ; Park, Yongtae |
Published in: |
Technological forecasting & social change : an international journal. - Amsterdam : Elsevier, ISSN 0040-1625, ZDB-ID 280700-2. - Vol. 73.2006, 7, p. 793-812
|
Subject: | Patent | Wissen | Knowledge | Messung | Measurement | USA | United States |
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