Optimal sensor distribution for multi-station assembly process using chaos-embedded fast-simulated annealing
Year of publication: |
2009
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Authors: | Shukla, N. ; Tiwari, M.K. ; Shankar, R. |
Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 47.2009, 1, p. 187-212
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