Optimisation of the process control in a semiconductor company : model and case study of defectivity sampling
Year of publication: |
2011
|
---|---|
Authors: | Shanoun, M. ; Bassetto, Samuel Jean ; Bastoini, S. ; Vialletelle, P. |
Published in: |
International journal of production research. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 160477-6. - Vol. 49.2011, 12/13 (15/1.6/7.), p. 3873-3890
|
Subject: | Halbleiterindustrie | Semiconductor industry | Statistische Qualitätskontrolle | Statistical quality control | Algorithmus | Algorithm | Frankreich | France |
-
Increasing detectability in semiconductor foundry by multivariate statistical process control
Yang, Chyan, (2008)
-
A broader view of the economic design of the X-bar chart in the semiconductor industry
Baud-Lavigne, Bertrand, (2010)
-
The effectiveness study of Double Sampling s charts application on destructive testing process
Lee, Pei-hsi, (2010)
- More ...
-
Shanoun, M., (2011)
-
Bassetto, Samuel Jean, (2009)
-
A broader view of the economic design of the X-bar chart in the semiconductor industry
Baud-Lavigne, Bertrand, (2010)
- More ...