Optimized allocation of defect inspection capacity with a dynamic sampling strategy
Year of publication: |
2015
|
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Authors: | Rodriguez-Verjan, Gloria Luz ; Dauzère-Péres, Stéphane ; Pinaton, Jacques |
Published in: |
Computers & operations research : and their applications to problems of world concern ; an international journal. - Oxford [u.a.] : Elsevier, ISSN 0305-0548, ZDB-ID 194012-0. - Vol. 53.2015, p. 319-327
|
Subject: | Semiconductor manufacturing | Linear programming | Capacity planning | Inspections | Wafers at Risk | Mathematische Optimierung | Mathematical programming | Kapazitätsplanung | Halbleiterindustrie | Semiconductor industry | Theorie | Theory | Produktionsplanung | Production planning | Produktionskapazität | Production capacity |
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