Optimum log‐logistic step‐stress model with censoring

Purpose – To obtain an optimal simple time‐step stress accelerated life test for the case involving pre‐specified censoring time. Such a test saves time and expenses over tests at normal conditions. Design/methodology/approach – Most of the available literature on step‐stress accelerated life testing deals with the exponential and weibull distribution. The log‐logistic life distribution has been found appropriate for high reliability components. Findings – The method developed has been illustrated using the data simulated from cumulative exposure log‐logistic step‐stress model with censoring time specified. Originality/value – The model suggested is appropriate in the field of high reliability components such as insulation system.