Original Papers - In Search of a Product Mix for Semiconductor Wafer Fabrication Facilities by a Combined Simulation-Neural Network Approach
Year of publication: |
2001
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Authors: | Yang, T. ; Su, C.-T. ; Feng, Y.-C. |
Published in: |
International journal of industrial engineering : applications and practice. - Cincinnati, ISSN 1072-4761, ZDB-ID 13637046. - Vol. 8.2001, 2, p. 142-149
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