Patent citation indicators : one size fits all?
Year of publication: |
[2016]
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Authors: | Bakker, Jurriën ; Verhoeven, Dennis ; Zhang, Lin ; Van Looy, Baart |
Publisher: |
Leuven : KU Leuven, Faculty of Economics and Business |
Subject: | patent citations | EPO,USPTO,PCT | patent family | multivariate analysis | Patent | Bibliometrie | Bibliometrics | EU-Staaten | EU countries | Wissenstransfer | Knowledge transfer | Patentrecht | Patent law |
Extent: | 1 Online-Ressource (circa 45 Seiten) Illustrationen |
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Series: | MSI. - Leuven : [Verlag nicht ermittelbar], ZDB-ID 2397378-X. - Vol. MSI_1609 |
Type of publication: | Book / Working Paper |
Type of publication (narrower categories): | Arbeitspapier ; Working Paper ; Graue Literatur ; Non-commercial literature |
Language: | English |
Source: | ECONIS - Online Catalogue of the ZBW |
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