Patent Quality : Towards a Systematic Framework for Analysis and Measurement
Year of publication: |
September 2020
|
---|---|
Authors: | Higham, Kyle W. |
Other Persons: | de Rassenfosse, Gaétan (contributor) ; Jaffe, Adam B. (contributor) |
Institutions: | National Bureau of Economic Research (contributor) |
Publisher: |
2020: Cambridge, Mass : National Bureau of Economic Research |
Subject: | Patent | Messung | Measurement | Innovation |
Extent: | 1 Online-Ressource illustrations (black and white) |
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Series: | NBER working paper series ; no. w27598 |
Type of publication: | Book / Working Paper |
Language: | English |
Notes: | System requirements: Adobe [Acrobat] Reader required for PDF files Mode of access: World Wide Web Hardcopy version available to institutional subscribers |
Other identifiers: | 10.3386/w27598 [DOI] |
Source: | ECONIS - Online Catalogue of the ZBW |
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