Patent Quality : Towards a Systematic Framework for Analysis and Measurement
Year of publication: |
2020
|
---|---|
Authors: | Higham, Kyle |
Other Persons: | de Rassenfosse, Gaétan (contributor) ; Jaffe, Adam B. (contributor) |
Publisher: |
[2020]: [S.l.] : SSRN |
Subject: | Patent | Messung | Measurement | Innovation |
Extent: | 1 Online-Ressource (49 p) |
---|---|
Type of publication: | Book / Working Paper |
Language: | English |
Notes: | Nach Informationen von SSRN wurde die ursprüngliche Fassung des Dokuments September 22, 2020 erstellt |
Other identifiers: | 10.2139/ssrn.3697223 [DOI] |
Classification: | O30 - Technological Change; Research and Development. General ; O34 - Intellectual Property Rights: National and International Issues |
Source: | ECONIS - Online Catalogue of the ZBW |
-
How to Measure and Draw Causal Inferences with Patent Scope
Kuhn, Jeffrey M., (2019)
-
Patent Citations - An Analysis of Quality Differences and Citing Practices in Hybrid Corn
Moser, Petra, (2016)
-
Measuring the degree of corporate innovation
Reeb, David M., (2017)
- More ...
-
Patent quality : Towards a systematic framework for analysis and measurement
Higham, Kyle, (2021)
-
Patent Quality : Towards a Systematic Framework for Analysis and Measurement
Higham, Kyle, (2022)
-
Wanted : A Standard for Virtual Patent Marking
de Rassenfosse, Gaétan, (2020)
- More ...