Pattern recognition for evaluator errors in a credit scoring model for technology-based SMEs
Year of publication: |
2012
|
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Authors: | Sohn, So Young ; Doo, M. K. ; Ju, Y. H. |
Published in: |
Journal of the Operational Research Society : OR. - Basingstoke, Hampshire : Palgrave, ISSN 0030-3623, ZDB-ID 716033-1. - Vol. 63.2012, 8, p. 1051-1064
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Subject: | KMU | SME | Kreditwürdigkeit | Credit rating | Kreditrisiko | Credit risk | Qualitative Methode | Qualitative method |
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