PCT Yearly Review: The International Patent System, Developments and Performance in 2008

The PCT Yearly Review provides an overview of the performance and development of the PCT system. It includes a comprehensive set of statistics for the latest available year.

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Authors:	WIPO
Institutions:	Economics and Statistics Division, Word Intellectual Property Organization (WIPO)
Subject:	IP Statistics

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Extent:	application/pdf text/html
Series:	WIPO Economics & Statistics Series.
Type of publication:	Book / Working Paper
Source:	RePEc - Research Papers in Economics

Persistent link: https://www.econbiz.de/10011196736