Physical vanity across cultures : measurement and validation
Anil Mathur, Benny Barak, Keun S. Lee and Yong Zhang; Stephen J. Gould
Year of publication: |
2010
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Authors: | Mathur, Anil ; Barak, Benny ; Lee, Keun S. ; Zhang, Yong ; Gould, Stephen J. |
Published in: |
Journal for global business advancement : JGBA. - Olney, Bucks : Inderscience Enterprises, ISSN 1746-966X, ZDB-ID 21933832. - Vol. 3.2010, 4, p. 313-324
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